XRM Conference Series History

The International Conference on X-ray Microscopy is the central conference of its community, attracting between 250-350 scientists in the field. XRM brings together experts in the development and use of X-ray microscopes, imaging methods and similar techniques. This conference addresses the most recent advances in X-ray microscopy technology as well as state of the art applications in a wide range of science disciplines through a program of talks, posters, and social interaction..

The XRM conference series started in Göttingen, Germany, in 1983 and is traditionally held every second year at sites near the most advanced light source facilities around the world, with the last XRM meeting taking place online, hosted by NSRRC in Taiwan, 2022. The last physical meeting, pre-pandemic, was held in Saskatoon, Canada in 2018.

XRM is a unique forum to discuss the novel imaging and microscopy possibilities at synchrotrons and X-ray lasers and to promote their applications in the challenge of different scientific problems. Both technical and scientific topics are discussed during the meeting, and each day features speakers grouped according to thematic areas, such as detectors; coherent imaging techniques; and novel optics, but also focusing on scientific results in eg. intra-cell-imaging; magnetic materials; and the application of X-ray spectromicroscopy in battery research. Poster sessions and an excursion to the MAX IV synchrotron will also be part of the program.

XRM I: Göttingen, Germany. 1983

Proceedings: Schmahl, G., and Rudolph, D. (Eds.) (1984), X-Ray Microscopy, Springer.

XRM II: Brookhaven, NY. 1987

Proceedings: Sayre, D., Howells, M., Kirz, J., Rarback, H. (Eds.) (1988), X-Ray Microscopy II, Springer.

XRM III: London, UK. 1990

Proceedings: Michette, A., Morrison, G. R., and Buckley, C. J. (Eds.) (1992), X-Ray Microscopy III, Springer.

XRM IV: Chernogolovka, Russia. 1993

Proceedings: Aristov, V. V., and Erko, A. I. (Eds.) (1994), X-Ray Microscopy IV, Chernogolovka, Russia.

XRM V: Würzburg, Germany. 1996

Proceedings: Thieme, J., Schmahl, G., Rudolph, D., and Umbach, E. (Eds.) (1998), X-ray Microscopy and Spectromicroscopy, Springer.

XRM99: Berkeley, CA. 1999

Proceedings: Tony Warwick , Werner Meyer-Ilse and David Atwood, Eds., X-ray Microscopy: Proceedings of the VI International Conference, AIP Conference Proceedings, 507, 2000.